This article is cited in 6 papers

Semiconductors

Optical investigation of the vertical diffusion of manganese in planar structures based on CdTe and Cd$_{1-x}$Mg$_x$Te with ultrathin MnTe layers

V. F. Agekyan^a, N. A. Grunina^a, A. Yu. Serov^a, N. G. Filosofov^a, G. Karczewski<sup>b

a</sup> Saint Petersburg State University
^b Institute of Physics, Polish Academy of Sciences, Warsaw, Poland

Abstract: The emission spectra of planar structures based on CdTe and Cd$_{1-x}$Mg$_x$Te containing periodically built-in MnTe layers with a nominal thickness of one monolayer have been investigated. The luminescence spectra and luminescence excitation spectra of manganese ions and excitons, as well as the dependences of the spectra on the temperature and magnetic field strength, are used to determine the actual distribution of manganese ions. The full width at half-maximum of the profile describing the change in the concentration of manganese in the growth direction of the structures is estimated to be 7–8 monolayers.

Received: 30.04.2014

 English version: Physics of the Solid State, 2014, 56:11, 2149–2154

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