This article is cited in 2 papers

Semiconductors

Modeling of the interrelation of mechanical and electrical parameters of the surface of solids

V. N. Yuzevich^a, B. P. Koman<sup>b

a</sup> G. V. Karpenko Physical-Mechanical Institute of the National Academy of Sciences of Ukraine
^b Ivan Franko National University of L'viv

Abstract: A mathematical model for the determination of physical constants in equations of state at the interface between a metal and an inert gas medium has been developed in terms of the surface physics and thermodynamics of nonequilibrium processes with due regard for internal stresses induced by a redistribution of conduction electrons. Physical characteristics of a surface layer, in particular, at the copper-inert gas medium interface and the silicon-inert gas medium interface, have been determined using experimental values of surface tensions and energies for contacting media.

Received: 02.08.2013
Accepted: 07.11.2013

 English version: Physics of the Solid State, 2014, 56:5, 929–936

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