Abstract:
The SrFe$_{2/3}$W$_{1/3}$O$_3$ multiferroic thin films were grown on a MgO(001) substrate using RF-cathode sputtering method in an oxygen atmosphere. It was found that the obtained SrFe$_{2/3}$W$_{1/3}$O$_3$ films are single-phase and single-crystal. According to the X-ray diffraction analysis they have a tetragonal unit cell with $a$ = $b$ = 3.930 $\mathring{\mathrm{A}}$ and $c$ = 3.964 $\mathring{\mathrm{A}}$ parameters. It was shown that the SrFe$_{2/3}$W$_{1/3}$O$_3$ films exhibit transparency ($T$ = 62–75%) in the visible and near-IR wavelength ranges. The dispersion dependences of the refractive index and absorption coefficient ($n(\lambda)$, $k(\lambda)$) of strontium ferrotungstate films were firstly determined in the wavelength range $\lambda$ = 350–1100 nm using the spectral ellipsometry method.
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