This article is cited in 5 papers

Ferroelectricity

Thickness dependence of the properties of epitaxial barium strontium titanate thin films

V. B. Shirokov^a, Yu. I. Golovko^a, V. M. Mukhortov^ab, Yu. I. Yuzyuk^b, P. E. Janolin^c, B. Dkhil<sup>c

a</sup> Southern Research Center of the Russian Academy of Sciences, Rostov-on-Don
^b Southern Federal University, Rostov-on-Don
^c LSPMS, Ecole Centrale Paris, Paris, France

Abstract: Heteroepitaxial Ba$_x$Sr$_{1-x}$TiO$_3$ thin films of different thicknesses have been studied in the paraelectric phase at a temperature of 600$^\circ$C. The lattice parameters of the film have nonlinear dependence on the thickness. The misfit strain and unit cell volume increase with decreasing thickness. The behavior of the misfit strain with variations in the thickness is well described in the model of the double electric layer formed during the synthesis of the film at the interface with the substrate.

Received: 08.12.2014
Accepted: 03.02.2015

 English version: Physics of the Solid State, 2015, 57:8, 1529–1534

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