Carbon and van der Waals materials

Exithon reflection spectra in thin layers WS$_2$

L. V. Kotova, T. E. Zedomi, V. P. Kochereshko

Ioffe Institute, St. Petersburg

Abstract: The spectra of polarised light reflection from WS$_2$ multilayers deposited on a Si/SiO$_2$ substrate were investigated. It was shown that the features of the photoluminescence and reflection spectra at energies in the range of 1.9–2.1 eV are related to the dimensional quantisation of polaritons in a WS$_2$ layer with a thickness of 0.32 mkm. The parameters of exciton polaritons, such as resonance frequency, oscillator strength, and damping, were determined. When studying the spectral dependence of the circular polarisation of light reflected from the sample, optical anisotropy was observed.

Keywords: spectroscopy, transition metal dichalcogenides, polarisation, excitons.

Received: 13.05.2025
Revised: 14.05.2025
Accepted: 14.05.2025

DOI: 10.61011/FTT.2025.05.60757.113-25

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