Semiconductors

Investigation of the behavior of electrical resistance and thermal emf of polycrystals of europium monosulfide during temperature cycling in the range of 320–800 K

N. N. Stepanov, G. A. Kamenskaja, S. V. Novikov

Ioffe Institute, St. Petersburg

Abstract: The temperature dependences of the electrical resistance $R$ and thermal $S$ of polycrystals of europium monosulfide (EuS) in the range 320–800 K have been studied. It is shown that the processes of cyclic temperature action on polycrystalline EuS samples lead to the appearance of hysteresis on the dependences $\ln[R(10^3/T)]$, $S(T)$, as well as a subsequent change of the main free charge carriers in a narrow temperature range of 365–490 K. The analysis of the discovered patterns in the behavior of ln $R$ and $S$ suggests the presence of a significant influence on the indicated kinetic coefficients of the processes of exciton spectrum formation and destruction in temperature cycles.

Keywords: europium monosulfide, thermal EMF, electrical resistivity, excitons.

Received: 17.04.2025
Revised: 18.04.2025
Accepted: 18.04.2025

DOI: 10.61011/FTT.2025.04.60544.84-25

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