Abstract:
Sr$_{0.6}$Ba$_{0.4}$Nb$_2$O$_6$ thin films of $\sim$ 550 nm thickness with a preliminarily deposited conductive SrRuO$_3$ layer of $\sim$ 150 nm thickness were grown on MgO(110) and MgO(001) substrates by RF-cathode sputtering in an oxygen atmosphere. X-ray diffraction studies have shown that the obtained films have no unit cell strain, while for barium-strontium niobate film on an MgO(110) substrate it has been found for the first time that the [001] polar axis lies in the interface plane with the substrate. It is shown that the films differ significantly in surface morphology, dielectric and ferroelectric properties measured in the out-of-plane direction.
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