Ferroelectricity

Phase composition, crystal structure, dielectric and ferroelectric properties of Ba$_2$NdFeNb$_4$O$_{15}$ thin films grown on a Si(001) substrate in an oxygen atmosphere

A. V. Pavlenko^a, T. S. Ilina^ab, D. A. Kiselev^b, D. V. Stryukov<sup>a

a</sup> Southern Research Center of the Russian Academy of Sciences, Rostov-on-Don, Russia
^b National University of Science and Technology «MISIS», Moscow, Russia

Abstract: The phase composition, nanostructure, and properties of Ba$_2$NdFeNb$_4$O$_{15}$/Si(001) multiferroic thin films have been studied by X-ray diffraction analysis, scanning probe microscopy, and capacitance-voltage characteristics analysis. The RF cathode sputtering in an oxygen atmosphere was used for films fabrication. It has been found that the obtained Ba$_2$NdFeNb$_4$O$_{15}$ films are single-phase, impurity-free, polycrystalline textured ($c$-oriented), and the out-of-plane strain is 0.8%, which leads to the presence of ferroelectric properties at room temperature. It is shown that the surface roughness of the films is $\sim$ 15.39 nm, the lateral size of the crystallites is $\sim$ 134 nm, and the relative permittivity in the temperature range of -190 $\dots$ 150$^\circ$C is 95–130. The reasons for the revealed regularities are discussed.

Keywords: multiferroic, dielectric characteristics, ferroelectric, tetragonal tungsten bronze.

Received: 27.01.2023
Revised: 27.01.2023
Accepted: 01.02.2023

DOI: 10.21883/FTT.2023.04.55295.13

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