Metals

Surface crystallization of amorphous Fe$_{73.8}$Si$_{13}$B$_{9.1}$Cu$_1$Nb$_{3.1}$ and Fe$_{77.5}$Si$_{13.5}$B$_9$ microwires

A. A. Fuks^ab, G. E. Abrosimova^a, O. I. Aksenov^a, A. S. Aronin<sup>a

a</sup> Osipyan Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region
^b National Research University Higher School of Economics, Москва, Россия

Abstract: Amorphous microwires of Fe$_{73.8}$Si$_{13}$B$_{9.1}$Cu$_1$Nb$_{3.1}$ and Fe$_{77.5}$Si$_{13.5}$B$_9$ composition fabricated by the Ulitovsky–Taylor method were studied. The samples with the glass shell removed were heated at temperatures of 753 K and 703 K for 20 min, afterwards, their structure was examined using X-ray diffraction. Subsequently, the thermally treated samples were chemically etched and X-ray diffraction study of the structure was again carried out. Experimental results on the predominant crystallization of near-surface regions were discussed assuming that mechanical stresses affect the nucleation and growth of nanocrystals.

Keywords: amorphous materials, stress distribution, nanocrystallization, X-ray diffraction.

Received: 07.10.2022
Revised: 07.10.2022
Accepted: 19.10.2022

DOI: 10.21883/FTT.2023.01.53919.494

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