Abstract:
Within the framework of the non-orthogonal tight-binding model, the influence of uniform stretching of bilayer graphene on the process of radiation formation of interlayer bridges in this structure was studied. Model calculations have shown that stretching bilayer graphene by 5% increases the total probability of the formation of defects of all types by $\sim$ 2 times. It is shown that the proportion of structures with interlayer bridges that have sufficient thermal stability for long-term existence at room temperature does not depend on deformation. In deformed and undeformed bilayer graphene, this fraction is $\sim$ 15%. One of the found stable structures with an interlayer bridge is a type of Frenkel pair and has an annealing activation energy of 2.11 eV. In earlier work, when simulating the irradiation of undeformed bilayer graphene within a similar model, this defect was not observed.
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