Abstract:
While using complex logical circuits, of special interest are the questions of
controlling the system and tracing and shooting troubles to the components
involved.
For controlling logical devices it is important to
construct minimal tests which can both to determine whether or not
the circuit is functioning properly and to recognize the kind and
the place of the fault. However, in many cases the practical construction of
testing procedures is labour-consuming. In this paper we consider some
classes of circuits for which the construction of such tests is
considerably simplified due to special features of the circuits. This work was supported by the Grant Centre for Research on Mathematics
attached to the Novosibirsk University.
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