This article is cited in 3 papers

Some classes of easily testable circuits in the Zhegalkin basis

Yu. V. Borodina

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences

Abstract: We identify the classes of Boolean functions that may be implemented by easily testable circuits in the Zhegalkin basis for constant type-1 faults on outputs of gates. An upper estimate for the length of a complete fault detection test for three-place functions is obtained.

Keywords: circuit of gates, constant faults, fault detection test, Zhegalkin basis.

UDC: 519.718.7

Received: 17.08.2021

DOI: 10.4213/dm1660

 English version: Discrete Mathematics and Applications, 2023, 33:1, 1–6

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