Yu. V. Borodina, “Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs”, Diskr. Mat., 2019, Volume 31, Issue 2,Pages <nobr>14

This article is cited in 5 papers

Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs

Yu. V. Borodina^ab

^a Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
^b Bauman Moscow State Technical University

Abstract: We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length $1$ in case of constant faults of type “1” at gate outputs.

Keywords: Boolean circuits, constant faults, fault detection tests, Zhegalkin basis.

UDC: 519.718.7

Received: 26.12.2018

DOI: 10.4213/dm1557