PHYSICS

Light reflection by a rough surface: interpretation of the ellipsometric measurements

L. S. Braginskii, I. A. Gilinskii, S. N. Svitasheva

Institute of Semiconductor Physics of USSR Academy of Sciences, Siberian Branch, Novosibirsk

UDC: 535.016

Presented: A. V. Rzhanov
Received: 09.01.1986