CRYSTALLOGRAPHY

Intensity of X-rays scattered by layered structures with short-range factors $S\ge1$, $G\ge1$

B. A. Sakharov, A. S. Naumov, V. A. Drits

Geological Institute, USSR Academy of Sciences, Moscow

UDC: 548.73:548.4

Presented: B. K. Vaĭnshteĭn
Received: 15.02.1982