RUS  ENG
Full version
JOURNALS // Avtomatika i Telemekhanika // Archive

Avtomat. i Telemekh., 2007 Issue 3, Pages 187–198 (Mi at962)

This article is cited in 7 papers

Technical Diagnostics

Local diagnostication in computer systems with the circulant structure

Yu. K. Dimitriev

Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia

Abstract: Studies are made of the possibility of diagnostication at the system level. The objects of the investigation are multiprocess fail-safe systems with the circulant diagnostic structure, in which the $t$-multiple failures at the level of processing modules are accepted. The results (outcomes) of the testing correspond to the known model of Preparata, Metze, and Chien. Conditions are found at which the technical state of each processing module can be defined on the basis of the analysis of the results of its testing only from adjacent modules.

PACS: 89.20.Ff; 89.75.Fb

Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 17.05.2006


 English version:
Automation and Remote Control, 2007, 68:3, 545–556

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026