This article is cited in 5 papers

Technical Diagnostics

The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS

G. P. Aksenova, V. F. Khalchev

Trapeznikov Institute of Control Sciences, Russian Academy of Sciences, Moscow, Russia

Abstract: The application of the method of parallel-sequential built-in self-testing (PSBST) to microcircuits of the type $FPGA$ is considered. Suggestions for the transformation of the $FPGA$ to the control-suitable form are given and costs for this transformation are estimated. The comparison is made for the costs of the PSBST method with the known testing methods.

PACS: 01.40.gf

Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 26.12.2005

 English version: Automation and Remote Control, 2007, 68:1, 149–159

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