This article is cited in 4 papers

Technical Diagnostics

Construction of self-testing in-built monitoring circuits for combinational devices

E. S. Sogomonyan

Moscow

Abstract: The problem of self-testing in-built monitoring circuit construction is investigated. It is shown that any single faults of the combinational device can be detected by the in-built monitoring circuit while this device is functioning. A structural method to obtain self-testing in-built module 2 monitoring circuit is proposed. The method is based on analysis of the device structure generalized graph and the use of Boolean derivatives.

UDC: 007.52+681.325.6


Received: 18.07.1973

 English version: Automation and Remote Control, 1974, 35:2, 280–289

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