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JOURNALS // Avtomatika i Telemekhanika // Archive

Avtomat. i Telemekh., 1990 Issue 8, Pages 156–164 (Mi at5790)

Technical Diagnostics

Test and functional diagnosis of digital devices with memory by built-in duplication

A. M. Zakaryan

Scientific-Production Center "Armintelsistem", Yerevan

UDC: 681.326.7:62-504


Received: 20.04.1989


 English version:
Automation and Remote Control, 1990, 51:8, 1135–1141

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© Steklov Math. Inst. of RAS, 2026