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JOURNALS
// Avtomatika i Telemekhanika
// Archive
Avtomat. i Telemekh.,
1991
Issue 7,
Pages
167–181
(Mi at4234)
Reliability
Parametric Bayesian Markov model of reliability growth by testing and development
V. P. Savchuk
,
V. B. Chernyavskii
Dnepropetrovsk State University
UDC:
519.718:519.213
Received:
06.09.1990
Fulltext:
PDF file (1887 kB)
English version:
Automation and Remote Control, 1991,
52
:7,
1015–1026
Bibliographic databases:
©
Steklov Math. Inst. of RAS
, 2026
Fulltext:
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