This article is cited in 2 papers

Technical Diagnostics

Detection of faults in combinational circuits by a self-dual test

M. Gessel'^a, A. V. Dmitriev^b, V. V. Sapozhnikov^b, Vl. V. Sapozhnokov<sup>b

a</sup> University of Potsdam
^b Petersburg State Transport University

UDC: 681.324.7

Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 14.05.1999

 English version: Automation and Remote Control, 2000, 61:7, 1192–1200

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