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JOURNALS
// Avtomatika i Telemekhanika
// Archive
Avtomat. i Telemekh.,
1993
Issue 6,
Pages
169–179
(Mi at2976)
Reliability
RAM of High Reliability Properties. II
A. S. Bernstein
,
Yu. L. Tomfield
,
I. V. Shagaev
Institute of Control Sciences, Russian Academy of Sciences
UDC:
681.327.2
Received:
20.05.1992
Fulltext:
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Steklov Math. Inst. of RAS
, 2026