M. Hessel, V. I. Moshanin, V. V. Sapozhnikov, Vl. V. Sapozhnokov, “Fault Detection in Self-Test Combination Circuits Using the Properties of Self-Dual Functions”, Avtomat. i Telemekh., 1997, Issue 12,Pages <nobr>193

This article is cited in 3 papers

Technical Diagnostics

Fault Detection in Self-Test Combination Circuits Using the Properties of Self-Dual Functions

M. Hessel^a, V. I. Moshanin^a, V. V. Sapozhnikov^b, Vl. V. Sapozhnokov^b

^a University of Potsdam, Germany
^b Petersburg State Transport University

UDC: 519.714.2

Received: 09.04.1996