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JOURNALS // Avtomatika i Telemekhanika // Archive

Avtomat. i Telemekh., 2001 Issue 4, Pages 148–159 (Mi at1771)

This article is cited in 4 papers

Technical Diagnostics

Self-Dual Self-Testing Multicycle Circuits: Their Properties

M. Gessel'a, A. V. Dmitrievb, V. V. Sapozhnikovb, Vl. V. Sapozhnokovb

a University of Potsdam, Germany
b Petersburg State Transport University

UDC: 519.714.2

Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 16.05.2000


 English version:
Automation and Remote Control, 2001, 62:4, 642–652

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© Steklov Math. Inst. of RAS, 2026