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// Avtomatika i Telemekhanika
// Archive
Avtomat. i Telemekh.,
2001
Issue 4,
Pages
148–159
(Mi at1771)
This article is cited in
4
papers
Technical Diagnostics
Self-Dual Self-Testing Multicycle Circuits: Their Properties
M. Gessel'
a
,
A. V. Dmitriev
b
,
V. V. Sapozhnikov
b
,
Vl. V. Sapozhnokov
b
a
University of Potsdam, Germany
b
Petersburg State Transport University
UDC:
519.714.2
Presented by the member of Editorial Board:
P. P. Parkhomenko
Received:
16.05.2000
Fulltext:
PDF file (207 kB)
Cited by
English version:
Automation and Remote Control, 2001,
62
:4,
642–652
Bibliographic databases:
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Steklov Math. Inst. of RAS
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