Abstract:
We propose a method for organizing the route-oriented method for diagnostics of digital systems (DS) with the structure of a symmetric bipartite graph. To describe the results of testing individual units, we use the Preparata–Metze–Chien model (PMC). We suppose that the system has a diagnostic monitor that initiates the diagnostic processes. To estimate the value of diagnosability in the analyzed DS, we use the method of potential syndromes. We show that the analyzed DS are no more than $1$-diagnosable without repair. For a system including seven processors and seven memory units, we consider an example with an unreliable diagnostics of three faulty components.