This article is cited in 1 paper

Technical Diagnostics

Decomposition of discrete devices for testable transformation

G. P. Aksenova, V. F. Khalchev

Institute of Control Sciences, Russian Academy of Sciences

UDC: 681.326.7

Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 19.11.1998

 English version: Automation and Remote Control, 1999, 60:7, 1012–1020

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